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[IEEE 7th Conference on Semi-insulating III-V Materials, - Ixtapa, Mexico (21-24 April 1992)] Proceedings of the 7th Conference on Semi-insulating III-V Materials, - Quantitative photoelastic characterization of residual strain and its correlation with dislocation density profile in semi-insulating LEC-grown GaAs wafers
Yamada, M., Fukuzawa, M., Kimura, N., Kaminaka, K., Yokogawa, M.Year:
1992
Language:
english
DOI:
10.1109/sim.1992.752700
File:
PDF, 573 KB
english, 1992