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Isometric Test Data Compression
Kumar, Amit, Kassab, Mark, Moghaddam, Elham, Mukherjee, Nilanjan, Rajski, Janusz, Reddy, Sudhakar, Tyszer, Jerzy, Wang, ChenYear:
2015
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2015.2432133
File:
PDF, 2.47 MB
english, 2015