CDM Simulation Based on Tester, Package and Full Integrated...

IEEE Transactions on Electron Devices 2012 / 11 Vol. 59; Iss. 11

CDM Simulation Based on Tester, Package and Full Integrated Circuit Modeling: Case Study

Abessolo-Bidzo, Dolphin, Smedes, Theo, Huitsing, Albert Jan
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Volume:
59
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2012.2213173
Date:
November, 2012
File:
PDF, 1.52 MB
english, 2012
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