![](/img/cover-not-exists.png)
Contactless measurement of conductivity of metals and semiconductors and of plating thickness of sheet conductors
Olszewski, Edward J., Cormack, George D.Volume:
IM-25
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/tim.1976.6312343
Date:
September, 1976
File:
PDF, 927 KB
english, 1976