Multifrequency Excitation and Support Vector Machine Regressor for ECT Defect Characterization
Bernieri, Andrea, Betta, Giovanni, Ferrigno, Luigi, Laracca, Marco, Mastrostefano, StefanoVolume:
63
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/tim.2013.2292326
Date:
May, 2014
File:
PDF, 1.97 MB
english, 2014