Laser-Induced Latchup Screening and Mitigation in CMOS...

IEEE Transactions on Nuclear Science 2006 / 08 Vol. 53; Iss. 4

Laser-Induced Latchup Screening and Mitigation in CMOS Devices

Mcmorrow, D., Buchner, S., Baze, M., Bartholet, B., Katz, R., O'Bryan, M., Poivey, C., Label, K.A., Ladbury, R., Maher, M., Sexton, F.W.
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Volume:
53
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2006.880929
Date:
August, 2006
File:
PDF, 3.02 MB
english, 2006
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