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Experimental Validation of a Tool for Predicting the Effects of Soft Errors in SRAM-Based FPGAs
Sterpone, L., Violante, M., Sorensen, R. Harboe, Merodio, D., Sturesson, F., Weigand, R., Mattsson, S.Volume:
54
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2007.910122
Date:
December, 2007
File:
PDF, 393 KB
english, 2007