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Strengthen Anti-ESD Characteristics in an HV LDMOS With Superjunction Structures
Chen, Shen-Li, Lai, Yi-ShengVolume:
30
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/tpel.2014.2336832
Date:
May, 2015
File:
PDF, 1.06 MB
english, 2015