Test Pattern Modification for Average IR-Drop Reduction
Ding, Wei-Sheng, Hsieh, Hung-Yi, Han, Cheng-Yu, Li, James Chien-Mo, Wen, XiaoqingYear:
2015
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2015.2391291
File:
PDF, 2.60 MB
english, 2015