[IEEE 2006 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2006.04.26-2006.04.28)] 2006 International Symposium on VLSI Design, Automation and Test - The HOY Tester-Can IC Testing Go Wireless?
Cheng-Wen Wu,, Chih-Tsun Huang,, Shi-Yu Huang,, Po-Chiun Huang,, Tsin-Yuan Chang,, Yu-Tsao Hsing,Year:
2006
Language:
english
DOI:
10.1109/vdat.2006.258155
File:
PDF, 1.75 MB
english, 2006