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[IEEE 2015 28th International Conference on VLSI Design (VLSID) - Bangalore, India (2015.1.3-2015.1.7)] 2015 28th International Conference on VLSI Design - Thermal-Aware Test Data Compression Using Dictionary Based Coding
Karmakar, Rajit, Chattopadhyay, SantanuYear:
2015
Language:
english
DOI:
10.1109/vlsid.2015.14
File:
PDF, 356 KB
english, 2015