[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Multitone digital signal based test for RF receivers
Zeidan, Mohamad A., Banerjee, Gaurab, Gharpurey, Ranjit, Abraham, Jacob A.Year:
2010
Language:
english
DOI:
10.1109/vts.2010.5469537
File:
PDF, 598 KB
english, 2010