[IEEE 2012 10th World Congress on Intelligent Control and Automation (WCICA 2012) - Beijing, China (2012.07.6-2012.07.8)] Proceedings of the 10th World Congress on Intelligent Control and Automation - M-nearest neighbor selection for two-phase test sample representation in face recognition
Ma, Xinjun, Wu, Ning, Liang, TiancaiYear:
2012
Language:
english
DOI:
10.1109/wcica.2012.6359361
File:
PDF, 610 KB
english, 2012