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[IEEE 2009 First IEEE International Workshop on Information Forensics and Security (WIFS) - London, United Kingdom (2009.12.6-2009.12.9)] 2009 First IEEE International Workshop on Information Forensics and Security (WIFS) - Leveraging reliable bits: ECC design considerations for practical secure biometric systems
Wang, Yige, Rane, Shantanu, Vetro, AnthonyYear:
2009
Language:
english
DOI:
10.1109/wifs.2009.5386479
File:
PDF, 159 KB
english, 2009