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Risk Analysis 2015 / 02

Bayesian Network Model with Application to Smart Power Semiconductor Lifetime Data

Plankensteiner, Kathrin, Bluder, Olivia, Pilz, Jürgen
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Language:
english
Journal:
Risk Analysis
DOI:
10.1111/risa.12342
Date:
February, 2015
File:
PDF, 990 KB
english, 2015
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