Applicability of compressive sensing on three-dimensional terahertz imagery for in-depth object defect detection and recognition using a dedicated semisupervised image processing methodology
Brook, Anna, Cristofani, Edison, Becquaert, Mathias, Lauwens, Ben, Jonuscheit, Joachim, Vandewal, MarijkeVolume:
22
Language:
english
Journal:
Journal of Electronic Imaging
DOI:
10.1117/1.jei.22.2.021004
Date:
January, 2013
File:
PDF, 6.09 MB
english, 2013