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SPIE Proceedings [SPIE Optics for Productivity in Manufacturing - Frankfurt, Federal Republic of Germany (Sunday 19 June 1994)] Optical Measurements and Sensors for the Process Industries - Imaging spectrometer for process industry applications
Herrala, Esko, Okkonen, Jukka T., Hyvarinen, Timo S., Aikio, Mauri, Lammasniemi, Jorma, Gorecki, Christophe, Preater, Richard W. T.Volume:
2248
Year:
1994
Language:
english
DOI:
10.1117/12.194344
File:
PDF, 685 KB
english, 1994