SPIE Proceedings [SPIE ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging - Beijing, China (Tuesday 25 June 2013)] International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications - Transient x-ray diffraction to measure the dynamic response of shocked lithium fluoride single crystal

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