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SPIE Proceedings [SPIE ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging - Beijing, China (Tuesday 25 June 2013)] International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications - Transient x-ray diffraction to measure the dynamic response of shocked lithium fluoride single crystal
Wang, Hai-rong, Ye, Yan, Yang, Qing-guo, Li, Mu, Xiao, Sha-li, Li, Ze-ren, Gu, Min, Yuan, Xiaocong, Qiu, MinVolume:
8911
Year:
2013
Language:
english
DOI:
10.1117/12.2034097
File:
PDF, 316 KB
english, 2013