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SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition - Design of automatic image measuring system based on RTX simulation system
Sharma, Gaurav, Zhou, Fugen, Liu, Jennifer, Gao, Wei, Zeng, Yi, Dong, Yan, Gu, Ye, Tong, GuanghengVolume:
9301
Year:
2014
Language:
english
DOI:
10.1117/12.2073163
File:
PDF, 386 KB
english, 2014