SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, USA (Sunday 8 February 2015)] Document Recognition and Retrieval XXII - Metric-based no-reference quality assessment of heterogeneous document images
Ringger, Eric K., Lamiroy, Bart, Nayef, Nibal, Ogier, Jean-MarcVolume:
9402
Year:
2015
Language:
english
DOI:
10.1117/12.2076150
File:
PDF, 2.48 MB
english, 2015