SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 7 February 2015)] Physics, Simulation, and Photonic Engineering of Photovoltaic Devices IV - Sufficient condition for perfect antireflection by optical resonance at dielectric interface
Freundlich, Alexandre, Guillemoles, Jean-François, Sugiyama, Masakazu, Wang, Ken X., Yu, Zongfu, Sandhu, Sunil, Liu, Victor, Fan, ShanhuiVolume:
9358
Year:
2015
Language:
english
DOI:
10.1117/12.2076242
File:
PDF, 6.44 MB
english, 2015