SPIE Proceedings [SPIE International Workshop on New Approaches to High Tech Materials: Nondestructive Testing and Computer Simulations in Materials Scienc - St. Petersburg, Russia (Monday 9 June 1997)] International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering - High-temperature single-hole silicon transistors
Bagraev, Nikolai T., Gehlhoff, Wolfgang, Klyachkin, Leonid E., Malyarenko, Anna M., Naeser, Alexander, Romanov, Vladimir V., Melker, Alexander I.Volume:
3345
Year:
1998
Language:
english
DOI:
10.1117/12.299589
File:
PDF, 562 KB
english, 1998