![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Developments in X-Ray Tomography II - Monte Carlo simulation of x-ray fluorescence and scattering tomography experiments
Vincze, Laszlo, Janssens, Koen, Vekemans, B., Adams, Freddy, Bonse, UlrichVolume:
3772
Year:
1999
Language:
english
DOI:
10.1117/12.363736
File:
PDF, 609 KB
english, 1999