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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Time and Frequency Metrology II - Ultrastable lasers: new developments and applications
Sterr, U., Legero, T., Kessler, T., Schnatz, H., Grosche, G., Terra, O., Riehle, F., Ido, Tetsuya, Reid, Derryck T.Volume:
7431
Year:
2009
Language:
english
DOI:
10.1117/12.825217
File:
PDF, 1.97 MB
english, 2009