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SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 12 April 2010)] Optics, Photonics, and Digital Technologies for Multimedia Applications - Measurement of shafts in the production process based on x-rays
Damm, Björn, Schelkens, Peter, Ebrahimi, Touradj, Schmitt, Robert, Rehbein, Arno, Cristóbal, Gabriel, Truchetet, Frédéric, Volk, Raimund, Neumann, Ernst, Saarikko, Pasi, Warrikhoff, Alexander, Hanke,Volume:
7723
Year:
2010
Language:
english
DOI:
10.1117/12.853592
File:
PDF, 4.11 MB
english, 2010