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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 25 April 2011)] Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Analysis of particles produced during airbag deployment by scanning electron microscopy with energy dispersive x-ray spectroscopy and their deposition on surrounding surfaces: a mid-research summary
Wyatt, J. Matney, Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Joy, David C., Maugel, Tim K.Volume:
8036
Year:
2011
Language:
english
DOI:
10.1117/12.883409
File:
PDF, 3.38 MB
english, 2011