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A method for determining the ambipolar diffusion length and carrier lifetime in GaAsp-i-ndiodes
Ayzenshtat, G. I., Yushchenko, A. Yu.Volume:
58
Language:
english
Journal:
Instruments and Experimental Techniques
DOI:
10.1134/s0020441215010236
Date:
March, 2015
File:
PDF, 301 KB
english, 2015