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OPTIMIZATION OF EMBEDDED CONTROLLERS BASED ON REDUNDANT TRANSITION REMOVAL AND FAULT SIMULATION USING K-WISE TESTS
GÖREN, SEZERVolume:
18
Language:
english
Journal:
Journal of Circuits, Systems and Computers
DOI:
10.1142/s0218126609005174
Date:
June, 2009
File:
PDF, 285 KB
english, 2009