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X-RAY ABSORPTION NEAR EDGE STRUCTURE INVESTIGATIONS OF GROUP III NITRIDES AND NITRIDED AIII-BV SEMICONDUCTOR SURFACES — FEFF CALCULATIONS AND ELECTRON YIELD MEASUREMENTS
CHASSÉ, T., HALLMEIER, K. H., HECHT, J.-D., FROST, F.Volume:
9
Language:
english
Journal:
Surface Review and Letters
DOI:
10.1142/s0218625x0200235x
Date:
February, 2002
File:
PDF, 1.35 MB
english, 2002