Depth Profiling of H...

Japanese Journal of Applied Physics 1994 / 2 Vol. 33; Iss. Part 1, No

Depth Profiling of H g 1- x C d x T e by Secondary Ion Mass Spectrometry: Detecting C s X + with C s + Ion Beam

Hayashi, Shun-ichi, Hashiguchi, Yoshihiro, Fujii, Satoshi, Kitazima, Hideo
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Volume:
33
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.33.1169
Date:
February, 1994
File:
PDF, 380 KB
english, 1994
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