[ACM Press the 43rd annual conference - San Francisco, CA, USA (2006.07.24-2006.07.28)] Proceedings of the 43rd annual conference on Design automation - DAC '06 - Generation of yield-aware Pareto surfaces for hierarchical circuit design space exploration
Tiwary, Saurabh K., Tiwary, Pragati K., Rutenbar, Rob A.Year:
2006
Language:
english
DOI:
10.1145/1146909.1146921
File:
PDF, 1.42 MB
english, 2006