![](/img/cover-not-exists.png)
A Direct Approach for Evaluating the Thermal Condition of a Silicon Substrate under Infrared Rays and Specular Reflectors
Habuka, HitoshiVolume:
146
Year:
1999
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.1391669
File:
PDF, 392 KB
english, 1999