A Shallow and Deep Trench Isolation Process Module for RF BiCMOS
Forsberg, Markus, Johansson, Ted, Liu, Wei, Vellaikal, ManojVolume:
151
Year:
2004
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.1811596
File:
PDF, 1.29 MB
english, 2004