[ECS ISTC/CSTIC 2009 (CISTC) - Shanghai, China (March 19 - March 20, 2009)] ECS Transactions - Atomistic-to-Continuum Modeling of Defect-Related Phenomena in Silicon Crystals
Sinno, Talid, Kapur, Sumeet S.Year:
2009
Language:
english
DOI:
10.1149/1.3096559
File:
PDF, 661 KB
english, 2009