[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - The Effect of a Threshold Failure Time on Electromigration Behavior of Copper Interconnects
Filippi, Ronald G., Lloyd, Jim, Wang, Ping-Chuan, Brendler, Andrew, Poulin, James, Demarest, J., Redder, BruceYear:
2009
Language:
english
DOI:
10.1149/1.3114549
File:
PDF, 961 KB
english, 2009