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[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Low-Temperature Measurements on Germanium-on-Insulator pMOSFETs: Evaluation of the Background Doping Level and Modeling of the Threshold Voltage Temperature Dependence
Van Den Daele, William, Augendre, Emmanuel, Romanjek, Krunoslav, Le Royer, Cyrille, Clavelier, Laurent, Damlencourt, Jean-Francois, Guiot, Eric, Ghyselen, Bruno, Cristoloveanu, S.Year:
2009
Language:
english
DOI:
10.1149/1.3117403
File:
PDF, 493 KB
english, 2009