Nanoscale Defect Generation in CMP of Low-k/Copper...

Nanoscale Defect Generation in CMP of Low-k/Copper Interconnect Patterns

Choi, Joo Hoon, Korach, Chad S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
156
Year:
2009
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.3243852
File:
PDF, 554 KB
english, 2009
Conversion to is in progress
Conversion to is failed