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Impact of Negative-Bias-Temperature-Instability on Channel Bulk of Polysilicon TFT by Gated PIN Diode Analysis
Huang, Chen-Shuo, Liu, Po-TsunVolume:
14
Year:
2011
Language:
english
Journal:
Electrochemical and Solid-State Letters
DOI:
10.1149/1.3551463
File:
PDF, 724 KB
english, 2011