ECS Transactions [ECS China Semiconductor Technology International Conference 2012 (CSTIC 2012) - Shanghai, China (March 18 - March 19, 2012)] - Fabrication of Thin Silicon PIN Detector Based on Wafer Bonding Technology
Dong, Xianshan, Yu, Min, Tian, Dayu, Wang, Jinyan, Xiang, Hongwen, Jin, YufengYear:
2012
Language:
english
DOI:
10.1149/1.3694480
File:
PDF, 157 KB
english, 2012