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Microscopic defect induced slow-mode degradation in II–VI based blue–green laser diodes
Masahiro Adachi, Zaw Min Aung, Kouichirou Minami, Keiichi Koizumi, Masashi Watanabe, Seiji Kawamoto, Tsutomu Yamaguchi, Hirofumi Kasada, Tomoki Abe, Koshi Ando, Kazushi Nakano, Akira Ishibashi, SatoshVolume:
214-215
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0022-0248(00)00267-0
File:
PDF, 259 KB
english, 2000