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In situ visualization and analysis of silicon carbide physical vapor transport growth using digital X-ray imaging
P.J Wellmann, M Bickermann, D Hofmann, L Kadinski, M Selder, T.L Straubinger, A WinnackerVolume:
216
Year:
2000
Language:
english
Pages:
10
DOI:
10.1016/s0022-0248(00)00372-9
File:
PDF, 457 KB
english, 2000