X-ray multi-crystal diffractometry analysis of heavily Te-doped GaAs grown by intermittent injection of TEGa/AsH3 in ultra high vacuum
Yutaka Oyama, Jun-ichi Nishizawa, Kohichi Seo, Ken SutoVolume:
213
Year:
2000
Language:
english
Pages:
8
DOI:
10.1016/s0022-0248(00)00386-9
File:
PDF, 199 KB
english, 2000