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Rapid high-resolution X-ray diffraction measurement and analysis of MOVPE pHEMT structures using a high-brilliance X-ray source and automatic pattern fitting
Tamzin Lafford, Mark Taylor, John Wall, Neil LoxleyVolume:
221
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0022-0248(00)00762-4
File:
PDF, 168 KB
english, 2000