Silicon defect and impurity studies using float-zone...

Silicon defect and impurity studies using float-zone crystal growth as a tool

T.F. Ciszek, T.H. Wang
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Volume:
237-239
Year:
2002
Language:
english
Pages:
7
DOI:
10.1016/s0022-0248(01)02325-9
File:
PDF, 249 KB
english, 2002
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