Dependence of the reflection high-energy electron...

Dependence of the reflection high-energy electron diffraction oscillation shape on the molecular migration time and the oscillation period

H.G. Lee, T.W. Kang, T.W. Kim
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Volume:
240
Year:
2002
Language:
english
Pages:
5
DOI:
10.1016/s0022-0248(02)00914-4
File:
PDF, 127 KB
english, 2002
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