Growth and characterization of epitaxial layers on aluminum...

Growth and characterization of epitaxial layers on aluminum nitride substrates prepared from bulk, single crystals

J. Carlos Rojo, Leo J. Schowalter, Remis Gaska, Michael Shur, M.A. Khan, J. Yang, Daniel D. Koleske
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Volume:
240
Year:
2002
Language:
english
Pages:
5
DOI:
10.1016/s0022-0248(02)01078-3
File:
PDF, 239 KB
english, 2002
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