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Refractive index and geometrical thickness measurement of thin optical samples by a transmitted Gaussian beam
Olvera-R, Octavio, Cywiak, Moisés, Cervantes-L, Joel, Cywiak, DavidVolume:
53
Language:
english
Journal:
Applied Optics
DOI:
10.1364/ao.53.006993
Date:
October, 2014
File:
PDF, 447 KB
english, 2014