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Helical-type surface defects in GaN thin films epitaxially grown on GaN templates at reduced temperatures
P.Q. Miraglia, E.A. Preble, A.M. Roskowski, S. Einfeldt, R.F. DavisVolume:
253
Year:
2003
Language:
english
Pages:
10
DOI:
10.1016/s0022-0248(03)00970-9
File:
PDF, 525 KB
english, 2003