High resolution X-ray diffraction mapping studies on the domain structure of LaAlO3 single crystal substrates and its influence on SrTiO3 film growth
Xin Wang, Ulf Helmersson, Jens Birch, Wei-Xin NiVolume:
171
Year:
1997
Language:
english
Pages:
8
DOI:
10.1016/s0022-0248(96)00671-9
File:
PDF, 624 KB
english, 1997