Growth of erbium-silicide films on (100) silicon as...

Journal of Crystal Growth 1997 Vol. 172; Iss. 1-2

Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction

N. Frangis, J. Van Landuyt, G. Kaltsas, A. Travlos, A.G. Nassiopoulos
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Volume:
172
Year:
1997
Language:
english
Pages:
8
DOI:
10.1016/s0022-0248(96)00745-2
File:
PDF, 496 KB
english, 1997
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